Ruud Tromp
Emeritus hoogleraar Fysica van oppervlakken en materialen
- Naam
- Prof.dr.ir. R.M. Tromp
- tromp@physics.leidenuniv.nl
Nieuws
-
Gestapeld grafeen spiegelt elektronenbundels -
Nieuwe transmissiemicroscoop voor elektronen met lage energie -
Elektronen geven resistlaag elektrische lading -
Nieuw boek over geschiedenis elektronmicroscopie met aandacht voor Leidse natuurkunde -
Beach workshop: ‘So you have a degree in Science. Now what?’
Oud-promovendi
Emeritus hoogleraar Fysica van oppervlakken en materialen
- Wiskunde en Natuurwetenschappen
- Leiden Instituut Onderzoek Natuurkunde
- LION - Quantum Matter & Optics
Contact
Adviseur electronenmicroscopie-research
- Wiskunde en Natuurwetenschappen
- Leiden Instituut Onderzoek Natuurkunde
- LION - Quantum Matter & Optics
- Stam W.G., Gaowei M., Echeverria E.M., Evans-Lutterodt K., Jordan-Sweet J., Juffmann T., Karkare S., Maxson J., Molen S.J. van der, Pennington C., Saha P., Smedley J. & Tromp R.M. (2024), Growth of ultra-flat ultra-thin alkali antimonide photocathode films, APL Materials 12: 061114.
- Neu P.S., Siskins M., Krasovskii E.E., Tromp R.M. & Molen S.J. van der (2023), Electron transmission and mean free path in molybdenum disulfide at electron-volt energies, Physical Review B: Condensed Matter 107(7): 075427.
- Jong T.A. de, Visser L., Jobst J., Tromp R.M. & Molen S.J. van der (2023), Stacking domain morphology in epitaxial graphene on silicon carbide, Physical Review Materials 7(3): 034001.
- Tebyani A., Tromp R.M. & Molen S.J. van der (2023), Critical role of electronic states above the vacuum level in photoelectron and secondary electron emission in few-monolayer pentacene films, Physical Review B 108(4): 045425.
- Boergens K.M, Wildenberg G., Li R., Lambert L., Moradi A., Stam W.G., Tromp R.M., Molen S.J. van der, King S.B. & Kasthuri N. (2023), Photoemission electron microscopy for connectomics. bioRxiv. [working paper].
- Neu P.S., Geelen D., Tromp R.M. & Molen S.J. van der (2023), Extracting transverse electron mean free paths in graphene at low energy, Ultramicroscopy 253: 113800.
- Moradi A., Rog M., Stam W.G., Tromp R.M. & Molen S.J. van der (2023), Back illuminated photo emission electron microscopy (BIPEEM), Ultramicroscopy 253: 113809.
- Tebyani A., Schramm S.M., Hesselberth M.B.S., Boltje D.B., Jobst J., Tromp R.M. & Molen S.J. van der (2023), Low energy electron microscopy at cryogenic temperatures, Ultramicroscopy 253: 113815.
- Jong T.A. de, Chen X., Jobst J., Krasovskii E.E., Tromp R.M. & Molen S.J. van der (2023), Low-Energy Electron Microscopy contrast of stacking boundaries: comparing twisted few-layer graphene and strained epitaxial graphene on silicon carbide. arXiv. [working paper].
- Jong T.A. de, Benschop T., Chen X., Krasovskii E., Dood M.J.A. de, Tromp R.M., Allan M.P. & Molen S.J. van der (2022), Imaging moiré deformation and dynamics in twisted bilayer graphene, Nature Communications 13: 70.
- Jong T.A. de, Visser L., Jobst J., Tromp R.M. & Molen S.J. van der (2022), Stacking domain morphology in epitaxial graphene on silicon carbide. arXiv. [working paper].
- Jong T.A. de, Benschop T., Chen X., Tromp R.M., Dood M.J.A. de & Allan M.P. Molen S.J. van der (2021), LEEM and the magic of twisted bilayer graphene. Physics@Veldhoven 2021, Veldhoven. 18 januari 2021 - 20 januari 2021. [conferentie poster].
- Neu P.S., Geelen D., Thete A., Tromp R.M. & Molen S.J. van der (2021), Complementary LEEM and eV-TEM for imaging and spectroscopy, Ultramicroscopy 222: 113199.
- Marchand R., Sachl R., Kalbac M., Hof M., Tromp R.M., Amaro M., Molen S.J. van der & Juffmann T. (2021), Optical near-field electron microscopy, Physical Review Applied 16(1): 014008.
- Tebyani A., Baalbergen F.B., Tromp R.M. & Molen S.J. van der (2021), Low-energy electron irradiation damage in few-monolayer pentacene films, The Journal of Physical Chemistry Part C 125(47): 26150-26156.
- Jong T.A. de, Kok D.N.L., Torren A.J.H. van der, Schopmans H., Tromp R.M., Molen S.J. van der & Jobst J. (2020), Quantitative analysis of spectroscopic Low Energy Electron Microscopy data: High-dynamic range imaging, drift correction and cluster analysis, Ultramicroscopy 213: 112913.
- Bespalov I., Zhang Y., Haitjema J., Tromp R.M., Molen S.J. van der, Brouwer A.M., Jobst J. & Castellanos S. (2020), The key role of very-low-energy-electrons in tin-based molecular resists for extreme ultraviolet nanolithography, ACS Applied Materials and Interfaces 12(8): 9881-9889.
- Jobst J., Boers L.M., Yin C., Aarts J., Tromp R.M. & Molen S.J. van der (2019), Quantifying work function differences using low-energy electron microscopy: The case of mixed-terminated strontium titanate, Ultramicroscopy 200: 43-49.
- Geelen D., Jobst J., Krasovskii E.E., Molen S.J. van der & Tromp R.M. (2019), Nonuniversal transverse electron mean free path through few-layer graphene, Physical Review Letters 123(8): 086802.
- Jong T.A. de, Jobst J., Krasovskii E.E., Molen S.J. van der, Ott C., Scholma D. & Tromp R.M. (2018), Data underlying the paper: Intrinsic Stacking domains in graphene on silicon carbide: a pathway for intercalation (data file and codebook): 4TU.Centre for Research Data. [dataset].
- Jong T.A. de, Krasovskii E.E., Ott C., Tromp R.M., Molen S.J. van der & Jobst J. (2018), Intrinsic stacking domains in graphene on silicon carbide: A pathway for intercalation, Physical Review Materials 2(10): 104005.
- Jobst J., Kautz J., Mytiliniou M., Tromp R.M. & Molen S.J. van der (2017), Low-energy electron potentiometry, Ultramicroscopy 181: 74-80.
- Thete A., Geelen D., Molen S.J. van der & Tromp R.M. (2017), Charge catastrophe and dielectric breakdown during exposure of organic thin films to low-energy electron radiation, Physical Review Letters 119(26): 266803.
- Jobst J., Torren A.J.H. van der, Krasovskii E.E., Balgley J., Dean C.R., Tromp R.M. & Molen S.J. van der (2016), Quantifying electronic band interactions in van der Waals materials using angle-resolved reflected-electron spectroscopy, Nature Communications 7: 13621.
- Kautz J., Janssen V.A.E.C., Tromp R.M. & Molen S.J. van der (2015), Differential reactivity of alkanethiols with Si, (111)–Au 2D surface alloys, Surface Science 632: L18-L21.
- Jobst J., Kautz J., Geelen D., Tromp R.M. & Molen S.J. van der (2015), Nanoscale measurements of unoccupied band dispersion in few-layer graphene, Nature Communications 6: 8926.
- Kautz J., Jobst J., Sorger C., Tromp R.M., Weber H.B. & Molen S.J. van der (2015), Low-Energy Electron Potentiometry: Contactless Imaging of Charge Transport on the Nanoscale, Scientific Reports 5: 13604.
- Kautz J., Copel M.W., Gordon M.S., Tromp R.M. & Molen S.J. van der (2014), Titration of submonolayer Au growth on Si(111), Physical Review B: Condensed Matter 89(3): 035416.
- Schramm S., Molen S.J. van der & Tromp R.M. (2012), Intrinsic Instability of Aberration-Corrected Electron Microscopes, Physical Review Letters 109(16): 163901.
- Tromp R.M., Wan W. & Schramm S. (2012), Aberrations of the Cathode Objective Lens up to Fifth Order, Ultramicroscopy 119: .
- Schramm S., Pang A.B., Altmann M. & Tromp R.M. (2012), A Contrast Transfer Function Approach for Image Calculations in Standard and Aberration-Corrected LEEM and PEEM, Ultramicroscopy 115: .
- Schramm S., Kautz J., Berghaus A., Schaff O., Tromp R.M. & Molen S.J. van der (2011), Low Energy Electron Microscopy and Spectroscopy with ESCHER: Status and Prospects, IBM Journal of Research and Development 55: 1:1-1:7.
- Sikharulidze I., Gastel R. van, Schramm S., Abrahams J.P., Poelsema B., Tromp R.M. & Molen S.J. van der (2011), Low energy electron microscopy imaging using Medipix2 detectors, Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment 633(Supplement 1): S239-S242.
- Gastel R. van, Molen S.J. van der & Tromp R.M. (2010), Oppervlakken filmen met trage elektronen, Nederlands Tijdschrift voor Natuurkunde oktober: 332-336.
- Gastel R. van, Sikharulidze I., Schramm S., Abrahams J.P., Poelsema B., Tromp R.M. & Molen S.J. van der (2009), Medipix 2 detector applied to low energy electron microscopy, Ultramicroscopy 110(1): 33-35.
- Frenken J.W.M., Tromp R.M. & Veen J.F. van der (1986), Theory and simulation of high-energy ion scattering experiments for structure analysis of surfaces and interfaces, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 17(4): 334-343.
- Research staff member at IBM USA