Daniël Geelen
Gastonderzoeker
- Naam
- Dr. D. Geelen MSc
- Telefoon
- +31 71 527 2727
- geelen@physics.leidenuniv.nl
- ORCID iD
- 0000-0003-3571-3898
Meer informatie over Daniël Geelen
In de media
Gastonderzoeker
- Wiskunde en Natuurwetenschappen
- Leiden Instituut Onderzoek Natuurkunde
- LION - Quantum Matter & Optics
- Neu P.S., Geelen D., Tromp R.M. & Molen S.J. van der (2023), Extracting transverse electron mean free paths in graphene at low energy, Ultramicroscopy 253: 113800.
- Neu P.S., Geelen D., Thete A., Tromp R.M. & Molen S.J. van der (2021), Complementary LEEM and eV-TEM for imaging and spectroscopy, Ultramicroscopy 222: 113199.
- Geelen D., Jobst J., Krasovskii E.E., Molen S.J. van der & Tromp R.M. (2019), Nonuniversal transverse electron mean free path through few-layer graphene, Physical Review Letters 123(8): 086802.
- Geelen D. (31 mei 2018), eV-TEM: transmission electron microscopy with few-eV electrons (Dissertatie. Institute of Physics, Science, Leiden University) Casimir PhD Series nr. 2018-13. Promotor(en) en copromotor(en): Tromp R.M., Molen S.J. van der.
- Thete A., Geelen D., Molen S.J. van der & Tromp R.M. (2017), Charge catastrophe and dielectric breakdown during exposure of organic thin films to low-energy electron radiation, Physical Review Letters 119(26): 266803.
- Geelen D., Thete A., Schaff O., Kaiser A. & Molen S.J. van der (2015), eV-TEM: Transmission electron microscopy in a low energy cathode lens instrument, Ultramicroscopy 159(482): .
- Thete A., Geelen D., Wuister S. & Molen S.J. van der (2015), Low-energy electron (0-100eV) interaction with resists using LEEM, Proc. SPIE 9422: .
- Jobst J., Kautz J., Geelen D., Tromp R.M. & Molen S.J. van der (2015), Nanoscale measurements of unoccupied band dispersion in few-layer graphene, Nature Communications 6: 8926.
- Geelen D. & Löffler W. (2013), Walsh modes and radial quantum correlations of spatially entangled photons, Optics Letters 38(20): 4108-4111.
- rondleiding basisschool